X-RAY OPTICS AND MICROANALYSIS: Proceedings of the 20th International Congress

Bok av International Congress on X-ray Optics and Microanalysis
"ICXOM Series" is a platform dedicated for reporting progress in fundamental and applied research in x-ray optics and micro- and nano-analysis by means of x-ray beams (with an ICXOM20 emphasis on synchrotron sources), electrons or other energetic particles, including application examples, as well as methodological and instrumental developments.