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Microelectronic test structures for CMOS technology
Bok av Manjul. Bhushan
Microelectronic Test Structures for CMOS Technology and Products addresses the basic concepts of the design of test structures for incorporation within test-vehicles, scribe-lines, and CMOS products. The role of test structures in the development and monitoring of CMOS technologies and products has become ever more important with the increased cost and complexity of development and manufacturing. In this timely volume, IBM scientists Manjul Bhushan and Mark Ketchen emphasize high speed characterization techniques for digital CMOS circuit applications and bridging between circuit performance and characteristics of MOSFETs and other circuit elements. Detailed examples are presented throughout, many of which are equally applicable to other microelectronic technologies as well. The authors' overarching goal is to provide students and technology practitioners alike a practical guide to the disciplined design and use of test structures that give unambiguous information on the parametrics and performance of digital CMOS technology.
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Microelectronic Test Structures for CMOS TechnologyEngelska - Pocket
ISBN: 9781489990556
ISBN: 9781489990556
Microelectronic Test Structures for CMOS TechnologyEngelska - Inbunden
ISBN: 9781441993762
ISBN: 9781441993762
Microelectronic test structures for cmos technologyEngelska - Okänt
ISBN: 9781441993779
ISBN: 9781441993779
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Microelectronic Test Structures for CMOS Technology
1225 kr
Finns i lager
Microelectronic Test Structures for CMOS Technology
1399 kr
Finns i lager